Double pulse test method for neutral point clamped inverter
Double pulse test is the industry standard for determining the switching characteristics of a semiconductor switch. The component manufacturers implement the do.
between specified levels. The Double Pulse Test is a commonly used test for analyzing the dynamic characteristics of power switching devices such as MOSFETs and IGBTs. Through the Double Pulse Test, the performance of power devices can be conveniently evaluated, and key parameters during both steady-state and dynamic processes can be obtained.
Simulation results of a double-pulse setup. Image used courtesy of Bodo's Power Systems [PDF] With a first pulse, the load inductance is magnetized up to the desired rated current, whereby switching off the current provides the first data (A) on the switch-off behavior at the operating point.
For testing the switching events in the buck mode of the converter, the short circuit connects the load inductor between the mid-point (load terminal) and the minus rail (depicted in Figure 2). For the boost mode, the load inductor is connected to the plus rail. Figure 3 shows the basic circuit diagram for double pulse testing.
Over the last 20 years, I have heard many—sometimes amusing—explanations for the double pulse. For example, “the double pulse is the characterization of an electrical quadrupole, with the first pulse describing the input and the second pulse the output.”
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